Module to be integrated into the caliber-planar control machine.
Inspection of:
– Integrity of the external and internal chamfer
– Perpendicularity between the horizontal and vertical chamfer (angles)
– Parallelism between the internal and external chamfer
– Chamfer measurement
Main advantages:
– Detection of very small and non-through chamfer defects. Thanks to the close-up cameras that frame a portion of the tile and the high resolution of the system, it is possible to detect very small chips, on the order of 2 mm.
-Increased quality of the final product, thanks to the detection of defects that would otherwise be difficult to identify.